Advances in Imaging and Electron Physics

Author: Peter W. Hawkes
Publisher: Elsevier
ISBN: 9780080490052
Format: PDF, ePub
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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 9780120147489
Format: PDF
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Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics

Author:
Publisher: Academic Press
ISBN: 9780123813138
Format: PDF, ePub, Mobi
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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Invaluable reference and guide for physicists, engineers and mathematicians

The Beginnings of Electron Microscopy

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 1483284654
Format: PDF, Mobi
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The Beginnings of Electron Microscopy presents the technical development of electron microscope. This book examines the mechanical as well as the technical problems arising from the physical properties of the electron. Organized into 19 chapters, this book begins with an overview of the history of scanning electron microscopy and electron beam microanalysis. This text then explains the applications and capabilities of electron microscopes during the war. Other chapters consider the classical techniques of light microscopy. This book presents as well the schematic outline of the preparation techniques for investigation of nerve cells by electron microscopy. The final chapter deals with the historical account of the beginnings of electron microscopy in Russia. This book is a valuable resource for scientists, technologists, physicists, electrical engineers, designers, and technicians. Graduate students as well as researcher workers who are interested in the history of electron microscopy will also find this book extremely useful.

Time Resolved Electron Diffraction

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 9780128001455
Format: PDF, ePub, Mobi
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Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates on all the latest developments in the field

Electron Backscatter Diffraction in Materials Science

Author: Adam J. Schwartz
Publisher: Springer Science & Business Media
ISBN: 9780306464874
Format: PDF, ePub
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Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).

Electronic Properties of Materials

Author: Rolf E. Hummel
Publisher: Springer
ISBN: 3642865380
Format: PDF, Kindle
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Books are seldom finished. At best, they are abandoned. The second edition of "Electronic Properties of Materials" has been in use now for about seven years. During this time my publisher gave me ample opportunities to update and improve the text whenever the Ibook was reprinted. There were about six of these reprinting cycles. Eventually, however, it became clear that substantially more new material had to be added to account for the stormy developments which occurred in the field of electrical, optical, and magnetic materials. In particular, expanded sections on flat-panel displays (liquid crystals, electroluminescence devices, field emission displays, and plasma dis. : plays) were added. Further, the recent developments in blue- and green emitting LED's and in photonics are included. Magnetic storage devices also underwent rapid development. Thus, magneto-optical memories, magneto resistance devices, and new' magnetic materials needed to be covered. The sections on dielectric properties, ferroelectricity, piezoelectricity, electrostric tion, and thermoelectric properties have been expanded. Of course, the entire text was critically reviewed, updated, and improved. However, the most extensive change I undertook was the conversion of all equations to SI units throughout. In most of the world and in virtually all of the interna tional scientific journals use of this system of units is required. If today's students do not learn to utilize it, another generation is "lost" on this matter. In other words, it is important that students become comfortable with SI units.

The Fractional Fourier Transform

Author: M. Alper Kutay
Publisher: John Wiley & Sons Incorporated
ISBN: 9780471963462
Format: PDF
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The discovery of the Fractional Fourier Transform and its role in optics and data management provides an elegant mathematical framework within which to discuss diffraction and other fundamental aspects of optical systems. This book explains how the fractional Fourier transform has allowed the generalization of the Fourier transform and the notion of the frequency transform. It will serve as the standard reference on Fourier transforms for many years to come.